Abstract
A method, apparatus and results of measurements of the degradation of semiconductor optoelectronic components (light-emitting diodes and photodiodes) are described. The difficulties that occur in such investigations are pointed out.
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Additional information
Translated from Izmeritel'naya Tekhnika, No. 10, pp. 33–35, October, 1996.
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Lovinskii, L.S. Precision measurements of the degradation of semiconductor optoelectronic components. Meas Tech 39, 1025–1027 (1996). https://doi.org/10.1007/BF02377470
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DOI: https://doi.org/10.1007/BF02377470