Skip to main content
SpringerLink
Log in

Some questions of ensuring the traceability of measurements of the parameters of involute surfaces

  • Metrological Service
  • Published:
Measurement Techniques Aims and scope

Abstract

The fundamental problems of the metrology of involute surfaces are considered. New approaches for investigating this field are proposed.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Conference TC/57 on Metrology of Quality Surfaces, Paris 1996.

  2. G. Ya. Gafanovich et al., Izmer. Tekh. No. 3, 15 (1976).

    Google Scholar 

  3. A. S. Litvinenko, Abstracts of Papers presented at the Fourth All-Union Conf. of Young Scientists and Gosstandart Specialists [in Russian], Kharkov (1980).

Download references

Authors
  1. A. I. Astashenkov
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

Translated from Izmeritel’naya Tekhnika, No. 8, pp. 66–67, August, 1996.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Astashenkov, A.I. Some questions of ensuring the traceability of measurements of the parameters of involute surfaces. Meas Tech 39, 883–885 (1996). https://doi.org/10.1007/BF02370207

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02370207

Keywords

Search

Navigation