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Invariants in metrology and technical diagnostics

  • General Topics in Metrology and Measurement Technology
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Measurement Techniques Aims and scope

Abstract

The interrelationship between metrology and technical diagnostics is analyzed. Parallels are noted in the ideas, concepts, and metrological and diagnostic procedures, including aims, objects, models, parameters, methods, apparatus, processing, and estimation of results. It is found to be promising to utilize the theory of invariants in metrology and technical diagnostics. Different types of invariant are given for linear dynamic systems.

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Authors
  1. L. A. Mironovskii
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  2. V. A. Slaev
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Additional information

Translated from Izmeritel'naya Tekhnika, No. 6, pp. 3–14, June, 1996.

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Mironovskii, L.A., Slaev, V.A. Invariants in metrology and technical diagnostics. Meas Tech 39, 577–593 (1996). https://doi.org/10.1007/BF02369819

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  • DOI: https://doi.org/10.1007/BF02369819

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