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Maximum-reliability parallel-serial structure with two types of component faults

  • Systems Analysis
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Cybernetics and Systems Analysis Aims and scope

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References

  1. V. L. Volkovich, A. F. Voloshin, V. A. Zaslavskii, and I. A. Ushakov, Models and Methods for Reliability Optimization of Complex Systems [in Russian], Naukova Dumka, Kiev (1993).

    Google Scholar 

  2. W. Gutjahr, G. Ch. Pflug, and A. Ruszscinski, Configuration of Series-Parallel Networks with Maximum Reliability, Preprint WP-93-60, IIASA, Laxenburg (1993).

    Google Scholar 

  3. B. W. Jenny and D. J. Sherwin, “Open and short circuit reliability of systems of identical items,” IEEE Trans. Reliability,R-35, 532–538 (1986).

    Google Scholar 

  4. L. B. Page and J. E. Perry, “Optimal ‘series-parallel’ networks of 3-state devices,” IEEE Trans. Reliability,R-37, 388–394 (1988).

    Google Scholar 

  5. R. E. Barlow and F. Proschan, Mathematical Theory of Reliability, Wiley, New York (1965).

    Google Scholar 

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Authors
  1. V. S. Kirilyuk
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Translated from Kibernetika i Sistemnyi Analiz, No. 1, pp. 34–46, January–February, 1995.

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Kirilyuk, V.S. Maximum-reliability parallel-serial structure with two types of component faults. Cybern Syst Anal 31, 25–36 (1995). https://doi.org/10.1007/BF02366793

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  • DOI: https://doi.org/10.1007/BF02366793

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