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Atomic Energy

, Volume 85, Issue 3, pp 667–668 | Cite as

“ReSPEKT-100” high-sensitivity energy-dispersion analyzer for analyzing the elemental composition of matter

  • I. A. Tolokonnikov
Scientific and Technical Communications
  • 20 Downloads

Keywords

Elemental Composition 
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References

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    I. A. Tolokonnikov, “Some directions in the investigation of energy-dispersion x-ray fluorescence analysis,”At. Énerg.,70, No. 6, 388–391 (1991).Google Scholar
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    I. A. Tolokonnika, O. V. Gorbatyuk, and K. I. Shchekin, “Application of the exciting quasimonoenergetic polarized radiation in energy-dispersion x-ray fluorescence analysis,”Ibid.,,69, No. 2, 115–117 (1990).Google Scholar
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    J. Knoth and H. Schwenke, “A new totally reflecting x-ray fluorescence spectrometer with detection limits below 10−11 g,” Fresenius Z. Anal. Chem.,301, 7–9 (1980).CrossRefGoogle Scholar
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    Yu. P. Sel'dyakov, A. B. Dorin, and M. V. Kondrashov, “New trend in the technology of nuclear instrument building—single-board spectrometers,”Novye Tekhnol.—21 Vek, No. 1, 38–41 (1997).Google Scholar

Copyright information

© Kluwer Academic/Plenum Publishers 1999

Authors and Affiliations

  • I. A. Tolokonnikov

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