Abstract
Enhanced yields from CHIX studies on non-conducting samples have demonstrated conclusively that such yields are exceptionally high when compared to PIXE at low incident particle energies. This was confirmed with low energy14N+,16O+ and20Ne+ ions whose X-ray production crosssections are negligibly small for PIXE yields. In particular, a combination of low incident energies and high X-ray yields could be useful for XSQR investigations and elemental studies with low energy accelerators. Furthermore, extended studies on pure metal targets revealed that the PIXE yield could be improved by insulating the targets thus making them suitable to produce the CHIX yield under identical experimental conditions. This paper discusses the complementary and competitive features of PIXE and CHIX.
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Pillay, A.E. PIXE and charge-induced X-rays (CHIX): Are they complementary or competitive?. J Radioanal Nucl Chem 241, 227–229 (1999). https://doi.org/10.1007/BF02347319
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DOI: https://doi.org/10.1007/BF02347319