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Data-reduction methods for semiconductor strain gages

Practical application of semiconductor strain gages depends heavily on the use of accurate, economical data reduction. Two basic means are simple “corrective” methods and accurate “table” methods

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Dorsey, J. Data-reduction methods for semiconductor strain gages. Experimental Mechanics 4, 19A–26A (1964). https://doi.org/10.1007/BF02329631

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  • DOI: https://doi.org/10.1007/BF02329631

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