Experimental Mechanics

, Volume 36, Issue 4, pp 404–411 | Cite as

A compact polariscope/shearing interferometer for mapping stress fields in bimaterial systems

  • H. Lee
  • S. Krishnaswamy
Article

Abstract

A compact optical device, which is a combination of a polariscope and a shearing interferometer (PSI), is described for mapping stress fields in bimaterial systems. The PSI device uses commercially available wave plates, and a calcite crystal for beam duplicating. It can operate in a variety of modes, including as a circular polariscope and as a shearing interferometer. In its polariscope mode, it can be used on birefringent materials such as Homolite and epoxy; in its shearing mode, it can be used on optically isotropic materials such as polymethylmethacrylate (PMMA) and glass. As an example, the device is used to obtain full-field maps of stress fields in the vicinity of an interfacial crack in an epoxy-PMMA bimaterial plate.

Keywords

Epoxy Mechanical Engineer Calcite Fluid Dynamics PMMA 

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Copyright information

© Society for Experimental Mechanics, Inc. 1996

Authors and Affiliations

  • H. Lee
    • 1
  • S. Krishnaswamy
    • 1
  1. 1.Department of Mechanical EngineeringNorthwestern UniversityEvanston

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