Abstract
This paper presents a new system for stress analysis, electro-optic modulation. The optical retardation resulting from stress is compensated for by induced birefringence in an electro-optic crystal under an applied voltage. When the compensation is complete the modulation signal changes, which signals that the measurement is complete. The sensitivity of measurement is higher than for other methods, easily less than λ/10000.
In order to accomplish an automatic process, the author also presents a set of magneto-optic equipment which is designed to rotate the direction of principal stress around the optical axis of the system. This process is automatic and does not require a large complex mechanical drive.
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References
Robert, A.J., “New Methods in Photoelasticity,”Experimental Mechanics,7 (5),224–232 (1967).
Young, W.C., “An Automated Process for Three-dimensional Photoelastic Analysis,”Experimental Mechanics,9 (6),275–280 (1969).
Penkovskil, A.I., et al., “IPL-453 Automatic Polarimeter,” Sov. J. Opt. Tech.,49 (3), (March 1982).
Redner, S., “New Automatic Polariscope System,”Experimental Mechanics,14 (12),486–491 (Dec. 1974).
Yariv, A., Introduction to Optical Electronics, 2nd Ed., 245–256 (1976).
Pant, B., “A Method for Determining Integral Fringe Orders in Photoelastic Analysis,”Experimental Mechanics,173–174 (July 1963).
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Zhang, Y. A fully automatic stress-analysis system by using electro-optic modulation. Experimental Mechanics 31, 344–347 (1991). https://doi.org/10.1007/BF02325991
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DOI: https://doi.org/10.1007/BF02325991