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Microradiographic strain measurement using markers

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Abstract

A method for measuring strain on interior planes of some real structural materials is presented. X-ray images are formed of small (10–40 micron) gold markers placed on selected interior planes of optically opaque X-ray transparent materials. The use of well collimated monochromatic synchrotron radiation makes possible high contrast images of the small markers. Images of the particles before and after straining are recorded photographically. Photographs are enlarged 33X and measured using a simple electro-optical setup. In calibration experiments using approximately a 300-micron gage length, the strain measured by this method agreed with extensometer measured strains to within 100 microstrain. Example applications in a graphite-epoxy composite are presented, including measurement of the strain drop off near the free edge, strain concentration around a hole, and the strain field on a particular plane near a hole after local delamination. The technique is currently limited to materials no less X-ray transparent than titanium.

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Jordan, E.H., Ochi, S.C.U., Pease, D. et al. Microradiographic strain measurement using markers. Experimental Mechanics 34, 155–165 (1994). https://doi.org/10.1007/BF02325712

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  • DOI: https://doi.org/10.1007/BF02325712

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