Abstract
The short-time behavior of viscoelastic materials has been traditionally studied on the millisecond time scale using steady sinusoidal excitation to measure the complex modulus and optical functions. A technique has now been developed for determining the short-time inverse optical-creep function on the microsecond time scale, using wave propagation in a rod. The method is demonstrated by characterizing an epoxy material in the time regime from 1 μs to 100μs.
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Abbreviations
- B i :
-
coefficients in a Galerkin approximation
- C :
-
elastic stress-optic coefficient, Pascals
- c :
-
speed of light, m/s
- E :
-
integrated square error in Galerkin approximation
- \(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{e}\) :
-
deviatoric strain tensor
- e i :
-
base functions for Galerkin approximation
- G :
-
shear relaxation modulus, Pascals
- h :
-
thickness of model, cm
- I i :
-
initial light intensity, W/m2
- I :
-
measured light intensity, W/m2
- K 2 :
-
polariscope calibration constant, W/m2
- L1, L2 :
-
polariscope stations
- M1, M2 :
-
magnet stations
- m :
-
actual fringe order (measured — residual)
- m i :
-
residual fringe order
- m 1 :
-
measured fringe order
- \(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{n}\) :
-
deviatoric refraction tensor
- n 1 , n 2 :
-
principal values of\(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{n}\)
- S :
-
deviatoric stress tensor, Pascals
- T :
-
total test time, s
- t :
-
time, s
- α:
-
angle between direction of polarization and principal axis of\(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{\sigma }\), rad
- Δ:
-
birefringence
- \(\delta _{ij}\) :
-
=1i=j
- \(\delta _{ij}\) :
-
=0i≠j
- \(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{\varepsilon }\) :
-
strain tensor
- λ:
-
wavelength of light, nm
- \(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{\sigma }\) :
-
stress tensor, Pascals
- \(\sigma _1 ,\sigma _2\) :
-
principal values of\(\underset{\raise0.3em\hbox{$\smash{\scriptscriptstyle\thicksim}$}}{\sigma }\), Pascals
- \(\sigma _A\) :
-
stress calculated from Galerkin approximation, Pascals
- τ:
-
dummy variable of integration
- \(\tau _i\) :
-
characteristic time of base functione i (t), s
- Φ:
-
\(\frac{{2\pi c}}{{h\omega }}\Omega\), Pascals/fringe
- ϕ:
-
isoclinic angle, rad
- ψ:
-
optical-creep function, fringes/Pascal
- Ω:
-
inverse optical-creep function, Pascals
- ω:
-
frequency of light, Hz
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Peeters, R.L., Parmerter, R.R. Optical calibration of photoviscoelastic materials on a microsecond time scale. Experimental Mechanics 14, 445–451 (1974). https://doi.org/10.1007/BF02324025
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DOI: https://doi.org/10.1007/BF02324025