Abstract
Post's white-light moiré interferometry was used to obtain sequential records of the transientU y -displacement fields associated with stable crack growth in 7075-T6 and 2024-0, single-edge-notched (SEN) specimens with fatigued cracks. TheU y -displacement fields are used to evaluate the crack-tip opening displacement (CTOD), far- and near-fieldJ-integral values, Dugdale-strip-yield model, William's polynomial function and the HRR field.
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Kang, B.S.J., Kobayashi, A.S. & Post, D. Stable crack growth in aluminum tensile specimens. Experimental Mechanics 27, 234–245 (1987). https://doi.org/10.1007/BF02318088
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DOI: https://doi.org/10.1007/BF02318088