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Small angle X-ray scattering study of imperfections in copper

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Summary

Upon annealing, the small angle X-ray scattering in deformed copper first increases and then decreases in the angle range between 10 and 30 minutes of arc. This result combined with Blin and Guinier's observation that under similar conditions the scattering decreases in the range of 1 1/2 to 7 degrees may be interpreted as an indication of clustering of defects prior to their disappearance.

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References

  1. Blin, J. and A. Guinier, C. R. Acad. Sci., Paris233 (1951) 1288.

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  2. Hayes, S., R. Smoluchowski and R. W. Turner, Phys. Rev.90 (1953) 350.

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  3. Dexter, D. L., Phys. Rev.90 (1953) 1007.

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  4. Dr. Guinier has kindly informed the authors that the existence of such a cross-over has indeed been confirmed.

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Authors and Affiliations

  1. Carnegie Institute of Technology, Pittsburgh, Pa, USA

    S. Hayes & R. Smoluchowski

Authors
  1. S. Hayes
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  2. R. Smoluchowski
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Hayes, S., Smoluchowski, R. Small angle X-ray scattering study of imperfections in copper. Appl. Sci. Res. 4, 10–12 (1955). https://doi.org/10.1007/BF02316464

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  • DOI: https://doi.org/10.1007/BF02316464

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