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High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics

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Abstract

The high resolution of a Bragg crystal diffraction spectrometer was used to investigate the ion charge distribution of krypton ions inside the plasma of an 14.5 GHz ECR ion source. Analyzing the measured spectra, we got information about the abundances and the relative densities of krypton ions of different charge states.

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Authors and Affiliations

  1. FS Physik, Institut für Kern- und Teilchenphysik, Technische Universität Dresden, Mommsenstr. 13, D-01062, Dresden, Germany

    U. Lehnert, C. Zippe & G. Zschornack

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  1. U. Lehnert
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  2. C. Zippe
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  3. G. Zschornack
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Lehnert, U., Zippe, C. & Zschornack, G. High resolution wavelength dispersive X-ray spectroscopy for ECR plasma diagnostics. Hyperfine Interact 99, 235–241 (1996). https://doi.org/10.1007/BF02274926

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