Abstract
The Electron Beam Ion Trap (EBIT) produces ions, confined within the electron beam, with charges ranging up to U92+ at near rest energies. This allows to study the interaction of a monoenergetic electron beam with any trapped ion to a high degree of precision via X-ray spectroscopy. The development of the EBIT into an ion (trap) source enables the possibility to perform for the first time studies of the interaction dynamics in strong fields of ions with matter where the ions carry hundreds of keV potential energy at very low kinetic energies (eV).
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Schneider, D. EBIT as a versatile experimental facility. Hyperfine Interact 99, 47–69 (1996). https://doi.org/10.1007/BF02274909
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DOI: https://doi.org/10.1007/BF02274909