Abstract
A polycrystalline silicon specimen, cut off from an ingot directionally solidified from upgraded metallurgical grade silicon /UMG-Si/ has been examined using a 1.45 MeV deuteron microbeam. The superficial distributions of carbon and oxygen were determined by direct observation of nuclear reactions. Several carbon concentration ranges were identified. Oxygen is always strongly correlated with carbon, but the nature of this correlation has to be specified. The presence of iron was shown inside areas with strong carbon precipitation.
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G. Revel, J.-L., Pastol, D. Hania, Nguyen Dinh Huynh, Proc. 5th E.C. Photovoltaic Solar Energy Conference, Kavouri /Athens/, Greece, 1983 /D. Reidel, Dordrecht, Holland, 1984/ 1037.
D. Hania, Thèse de Doctorat de 3ème cycle, Spécialité Energétique, Université Paris VII, 1984; G. Revel, D. Hania, J.-L. Pastol, Proc. M.R.S. Meeting: Polymicrocrystalline and amorphous semiconductors, Strasbourg, France, 1984 /Les Editions de Physique, Les Ulis, France 1984/ 147.
R. Baulac, G. Revel, D. Hania, J.-L., Pastol, Nguyen Dinh Huynh, M. Rodot, J.-E., Bouree, C. Leray, Le Quang, Nam, F. Dubrous, M. Bargues, Proc. 5th E.C. Photovoltaic Solar Energy Conference, Kavouri /Athens/, Greece, 1983 /D. Reidel, Dordrecht, Holland 1984/ 1053.
S. Pizzini, M. Rustioni, Proc. 6th E.C. Photovoltaic Solar Energy Conf., London, G.B., 1985 /D. Reidel, Dordrecht, Holland, 1986/ 875.
H.A. Aulich, L. Bernewitz, H.J. Fencz, H. Pinck, F.W. Schule, Proc. M.R.S. Meeting: Poly-microcrystalline and amorphous semiconductors, Strasbourg, France, 1984 /Les Editions de Physique, Les Ulis, France 1984/ 175.
C. Cabanel, J.-Y. Laval, J.-L. Pastol, G. Revel, Proc. 7th E.C. Photovoltaic Solar Energy Conference, Sevilla, Spain, 1986 /to be published: D. Reidel, Dordrecht, Holland/.
Ch. Engelmann, J. Bardy, Rapport C.E.A. R-5340, 1986.
G. Blondiaux, A. Giovagnoli, M. Valladon, J.-L. Debrun, J.-Y. Barraud, Proc. I.E.E.E. Trans. Nuclear Science /NS-30, 1983/ 1619.
T. Nozaki, Y. Yatsuguri, Y. Endo,J. Radioanal. Nucl. Chem., 32 /1976/ 43.
M. Mosbah, N. Metrich, R. Clocchiatti, P. Trocellier, Proc. 11th Intern. Conf. on X-Ray Optics and Micro-analysis, London, Ontario, 4–8 Aout 1986 /to be published by San Francisco Press/.
B. Wildenthal, R. Krone, F. Prosser Jr.,Phys. Rev., B 135 /1964/ 680.
G. Revel, N. Deschamp, C. Dardenne, J.-L. Pastol, D. Hania, Nguyen Din Huynh,J. Radioanal. Nucl. Chem., Lett., 85 /1984/ 137.
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Trocellier, P., Cabanel, C., Pastol, J.L. et al. Determination of carbon and oxygen in polysilicon using a nuclear microprobe. Journal of Radioanalytical and Nuclear Chemistry Letters 118, 89–98 (1987). https://doi.org/10.1007/BF02166265
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DOI: https://doi.org/10.1007/BF02166265