Journal of Radioanalytical and Nuclear Chemistry

, Volume 155, Issue 2, pp 91–95 | Cite as

Analysis of high-temperature superconducting films by X-ray fluorescence analysis

  • V. Kliment
Article

Abstract

Radionuclide X-ray fluorescence analysis was used for the determination of Cu, Y and Ba in very thin high-temperature superconducting films. The precision of the method is better than 3% for about 1 μm thick films. The atomic emission ICP spectrometry was used to testify results of XRF analysis. An acceptable agreement of both methods was obtained.

Keywords

Physical Chemistry Inorganic Chemistry Radionuclide Thick Film Atomic Emission 

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Copyright information

© Akadémiai Kiadó 1991

Authors and Affiliations

  • V. Kliment
    • 1
  1. 1.Institute of PhysicsSlovak Academy of SciencesBratislavaČSFR

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