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Experientia

, Volume 23, Issue 5, pp 352–352 | Cite as

Contribution to the method for approximation of X-ray diffraction line profile

  • G. V. Davydov
  • N. A. Erokhov
  • G. F. Belyaeva
Specialia

Keywords

Line Profile Diffraction Line Diffraction Line Profile 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Выводы

Предложена функция для аппроксимации дифракционного профиля рентгеновских линий. Получены формулы для расчета максимума, центра тяжести профиля и интегральной щирины линии. Проведена экспериментальная проверка метода на примере алюминия.

Literatur

  1. 1.
    N. C. Halder, Physica,30, 1044 (1964).Google Scholar
  2. 2.
    B. P. Demidovich, I.A. Maron andE. Z. Shuvalova,Tchislennyeh Methody analiza, F. M. L. (1963).Google Scholar
  3. 3.
    Eq. (II) serves for determinationγ andε.Google Scholar
  4. 4.
    No corrections were introduced in calculation, and the parametersε andγ obtained by the mean-values method were used.Google Scholar
  5. 5.
    B. W. Delf, Brit. J. Appl. Phys.14, 345 (1963).Google Scholar

Copyright information

© Birkhäuser Verlag 1967

Authors and Affiliations

  • G. V. Davydov
    • 1
  • N. A. Erokhov
    • 1
  • G. F. Belyaeva
    • 1
  1. 1.Chair of Solid State PhysicsPedagogical State InstituteMoscowUdSSR

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