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X-ray research for polycrystals. The formation geometry of instrumental width of the diffractional line at the investigation of the polycrystals in the translucent X-rays

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Решена задача инструментального расширения линии при исследовании поликристаллов в проходящих рентгеновских лучах при следующих условиях: источник лучей точечный, образец плоский, имеющий определенную толщину и площадь облучения, и линия регистрации рефлексов - прямая, параллельная плоскости образца (рисунок).

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References

  1. G. V. Davydov, Physica Status Solidi18, 41 (1966).

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  2. G. V. Davydov, Physica Status Solidi18, K 145 (1966).

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Authors and Affiliations

  1. Pedagogical State Institute, G-435, Moskva, USSR

    G. V. Davydov (Chair of Solid State Physics) & L. J. Vasilevskaya

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  1. G. V. Davydov
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  2. L. J. Vasilevskaya
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Davydov, G.V., Vasilevskaya, L.J. X-ray research for polycrystals. The formation geometry of instrumental width of the diffractional line at the investigation of the polycrystals in the translucent X-rays. Experientia 24, 654–655 (1968). https://doi.org/10.1007/BF02138290

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  • DOI: https://doi.org/10.1007/BF02138290

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