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Translated from Izmeritel'naya Tekhnika, No. 9, pp. 50–52, September, 1989.
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Globus, M.E., Zagarii, L.B. & Tsirlin, Y.A. Factors influencing x-ray scintillation-counter metrological-characteristic stability. Meas Tech 32, 921–924 (1989). https://doi.org/10.1007/BF02112516
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DOI: https://doi.org/10.1007/BF02112516