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Factors influencing x-ray scintillation-counter metrological-characteristic stability

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Measurement Techniques Aims and scope

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Literature cited

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Translated from Izmeritel'naya Tekhnika, No. 9, pp. 50–52, September, 1989.

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Globus, M.E., Zagarii, L.B. & Tsirlin, Y.A. Factors influencing x-ray scintillation-counter metrological-characteristic stability. Meas Tech 32, 921–924 (1989). https://doi.org/10.1007/BF02112516

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  • DOI: https://doi.org/10.1007/BF02112516

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