Abstract
The resonant cavity perturbation method as described in the preceding two parts of this series is applied to study the electrodynamical properties of different materials in the microwave and millimeter wave spectral range. We briefly discuss the relevant uncertainties which are asociated with the different measurement techniques and we find that employing the amplitude technique it is possible to measure both the width and frequency to nearly the same precision. We then demonstrate the broad range of applicability of this technique by showing results obtained on several different materials, ranging from an insulator to a superconductor. The performance limitations of this technique are discussed in detail.
Similar content being viewed by others
References
A. v. Hippel,Dielectrics and Waves (Wiley, New York, 1954).
A. v. Hippel,Dielectric Materials and Applications (Technology Press M.I.T., Wiley, Cambridge/New York, 1954).
M. Sucher and J. Fox,Handbook of Microwave Measurements, Third Edition (Polytechnic Press, New York/London, 1963).
H. W. Helberg and B. Wartenberg,Z. angew. Phys. 20, 505 (1966).
M. N. Afsar and K. J. Button,Proc. IEEE 73, 131 (1985).
G. Grüner,Rev. Mod. Phys. 60, 1129 (1988).
N. F. Mott and E. A. Davis,Electronic Processes in Non-Crystalline Materials, Second Edition (Clarendon Press, Oxford, 1979).
B. I. Shklovskii and A. L. Efros,Electronic Properties of Doped Semiconductors (Springer-Verlag, Berlin/Heidelberg/New York, 1984), (Springer Series in Solid-State Science 45).
L. I. Buranov and I. F. Shchegolev,Instrum. & Exp. Tech. 14, 528 (1971).
I. F. Shchegolev,Phys. Stat. Sol. (a) 12, 9 (1972).
M. Dressel, H. W. Helberg, and D. Schweitzer,Synth. Met. 41–43, 2043 (1991), and references therein.
O. Klein, S. Donovan, M. Dressel, and G. Grüner,Int. J. Infrared and Millimeter Waves 14 (1993) (pre-preceding article).
S. Donovan, O. Klein, M. Dressel, K. Holczer, and G. Grüner,Int. J. Infrared and Millimeter Waves 14 (1993) (preceding article).
K. Bender, K. Dietz, H. Endres, H. W. Helberg, I. Hennig, H. J. Keller, H. W. SchÄfer, and D. Schweitzer,Mol. Cryst. Liq. Cryst. 107, 45 (1984).
M. Dressel, G. Grüner, J. P. Pouget, A. Breining, and D. Schweitzer (submitted toJ. Phys. (France) I).
D. Jérome and H. J. Schulz,Adv. Phys. 31, 299 (1982).
S. Donovan, Y. Kim, L. Degiorgi, and G. Grüner,J. Phys. I. (France) 3, 1493 (1993).
S. Donovan, M. Dressel, Y. Kim, L. Degiorgi, G. Grüner, and W. Wonneberger, Submitted toPhys. Rev. B, June 1993.
K. Bechgaard, C. S. Jacobsen, K. Mortensen, H. J. Pedersen, and N. Thorup,Solid State Commun. 33, 1119 (1980).
B. Gallois, J. Gaultier, C. Hauw, D. Chasseau, A. Meresse, A. Filhol, and K. Bechgaard,Mol. Cryst. Liq. Cryst. 119, 225 (1985).
R. Pott and R. Schefzyk,J. Phys. E: Sci. Instrum. 16, 444 (1983).
J. L. Ferraris and T. F. Finnegan,Solid State Commun. 18, 1169 (1976).
J. L. Miane, F. Carmona, and P. Delhaes,Phys. Stat. Sol. (b) 111, 235 (1982).
H. Urayama, H. Yamochi, G. Saito, K. Nozawa, T. Sugano, M. Kinoshita, S. Sato, K. Oshima, A. Kawamoto, and J. Tanaka,Chem. Lett., 1988.
K. Holczer, D. Quinlivan, O. Klein, and G. Grüner,Solid State Commun. 76, 499 (1990).
O. Klein, K. Holczer, G. Grüner, J. J. Chang, and F. Wudl,Phys. Rev. Lett. 66, 655 (1991).
M. Dressel, O. Klein, G. Grüner, K. D. Carlson, H. H. Wang, and J. M. Williams, (to be published).
D. R. Harshman, R. N. Kleiman, R. C. Haddon, S. V. Chichester-Hicks, M. L. Kaplan, L. W. Rupp, T. Pfiz, D. L. Williams, and D. B. Mitzi,Phys. Rev. Lett. 64, 1293 (1990).
M. Dressel, S. Brader, G. Grüner, K. D. Carlson, H. H. Wang, and J. M. Williams,Phys. Rev. B (in press).
O. Klein, K. Holczer, and G. Grüner, (to be published).
B. W. Maxfield and W. L. M. Lean,Phys. Rev. 139, A1515 (1965).
D. C. Mattis and J. Bardeen,Phys. Rev. 111, 412 (1958).
M. Tinkham,Introduction to Superconductivity (Mc Graw-Hill, New York, 1975).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Dressel, M., Klein, O., Donovan, S. et al. Microwave cavity perturbation technique: Part III: Applications. Int J Infrared Milli Waves 14, 2489–2517 (1993). https://doi.org/10.1007/BF02086218
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02086218