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XPS study of the in-depth profile of TiO2−Al2O3 catalysts prepared by different methods

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Abstract

An XPS study of in-depth profiles of Ti/Al ratio in TiO2−Al2O3 catalysts in conjunction with sputter-etching by Ar+ has revealed that the sample prepared with ammonia as precipitation reagent has constant Ti/Al ratio from surface layer to bulk, while the smaple prepared with urea has much Al in the surface layer.

Abstract

Исследования РФС профилей отношения Ti/Al по глубине в катализаторе TiO2−Al2O3 вместе с вытравлением с помощью Ar+ подтверждают, что образцы, приготовленные с помощью аммиака как высадителя, имеют постоянное отношение Ti/Al с поверхности вдоль по глубине, в то время как образцы, приготовленные с помщьы мочевины, содержат больше алюминия в поверхностном слое.

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Authors and Affiliations

  1. Department of Chemistry, Faculty of Science, Hokkaido University, 060, Sapporo, Japan

    E. Rodenas & H. Hattori

  2. Research Institute for Catalysis, Hokkaido University, Sapporo, Japan

    I. Toyoshima

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  1. E. Rodenas
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  2. H. Hattori
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  3. I. Toyoshima
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Rodenas, E., Hattori, H. & Toyoshima, I. XPS study of the in-depth profile of TiO2−Al2O3 catalysts prepared by different methods. React Kinet Catal Lett 16, 73–76 (1981). https://doi.org/10.1007/BF02077032

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  • DOI: https://doi.org/10.1007/BF02077032

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