The EMI properties of microstrip circuits in enclosures with slot apertures

  • Bing-Zhong Wang
  • Guanqiang Zhang
  • Gaofeng Wang


Microstrips terminated with resistive loads in enclosures with slot apertures are studied by the FDTD method. The FDTD simulation shows that the EMI signal levels induced in the microstrip circuits are strongly affected by the orientation of the circuit related to the direction of the slot.


Resistive Load FDTD Method FDTD Simulation Microstrip Circuit Slot Aperture 
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Copyright information

© Plenum Publishing Corporation 1996

Authors and Affiliations

  • Bing-Zhong Wang
    • 1
  • Guanqiang Zhang
    • 2
  • Gaofeng Wang
    • 3
  1. 1.Institute of Applied PhysicsUniversity of Electronic Science and Technology of ChinaChengduPeople's Republic of China
  2. 2.Institute of Telecommunication EngineeringNanjingPeople's Republic of China
  3. 3.Tanner ResearchPasadenaUSA

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