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Frustrated total internal reflection investigation of surface phenomena and diffusion phenomena on the interface between organosilicon compounds and epoxy resin

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Literature cited

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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 17, No. 5, pp. 911–913, November, 1972.

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Spasskova, N.P., Lesnevskaya, L.V., Guseva, G.N. et al. Frustrated total internal reflection investigation of surface phenomena and diffusion phenomena on the interface between organosilicon compounds and epoxy resin. J Appl Spectrosc 17, 1500–1501 (1972). https://doi.org/10.1007/BF02066467

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  • DOI: https://doi.org/10.1007/BF02066467

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