Abstract
The samples were introduced into the XRF spectrometer in ordinary flat bottom polyethylene bottles for the estimation of Zr or Hf in presence of one another in solution. By using high voltage (50 kV) and high current (50 mA) least limits of detection obtained were an order of magnitude better than other conventional analytical techniques. Relations of intensity to concentration in various concentration ranges have been determined and the results are compared with those of other analytical techniques.
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Afzal, M., Hanif, J., Hanif, I. et al. Determination of zirconium and hafnium in solution by X-ray fluorescence spectrometry. Journal of Radioanalytical and Nuclear Chemistry, Articles 139, 203–214 (1990). https://doi.org/10.1007/BF02061804
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DOI: https://doi.org/10.1007/BF02061804