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Evaluation of thick target PIXE analyses with a minicomputer

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Abstract

Thick target particle-induced X-ray emission (TTPIXE) spectrometry has been increasingly used for multielement and trace element analyses. The theoretical background and a formalism are presented for their evaluation by means of a minicomputer. Numerical results are given and compared with the experimental ones. The advantage of the program is shown by a special experimental example.

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Authors and Affiliations

  1. Sektion Physik, Karl-Marx-Universitaet Leipzig, Linnestr. 5, DDR-7010, Leipzig, GDR

    H. Frey, J. Vogt & G. Otto

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  1. H. Frey
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  2. J. Vogt
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  3. G. Otto
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Frey, H., Vogt, J. & Otto, G. Evaluation of thick target PIXE analyses with a minicomputer. Journal of Radioanalytical and Nuclear Chemistry, Articles 99, 193–202 (1986). https://doi.org/10.1007/BF02060840

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  • DOI: https://doi.org/10.1007/BF02060840

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