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The analysis of ruthenium catalysts by photon-induced X-ray fluorescence using a microcomputer for data acquisition and analysis

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Abstract

An improved method for the determination of ruthenium in catalytic materials based on a relative fluorescence ratio factor is presented. This method employs a thin-film technique and an internal standard technique to minimize absorption and enchancement effects. The samples and standards were fluorescent with a109Cd (7 mCi) annular source for 200 seconds and the data were collected and analyzed with an Apple II+ micro computer. Precision (total variation) for typical ruthenium catalysts in the range of 1–5% ruthenium was about 2%. Finally, the concentration of ruthenium in six commercial catalysts was determined for both alumina and carbon supports.

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Authors and Affiliations

  1. Instituto Venezolano de Investigaciones Científicas-IVIC, Apartado 1827, 1010-A, Caracas, (Venezuela)

    J. J. LaBrecque, P. A. Rosales & E. Marcano

Authors
  1. J. J. LaBrecque
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  2. P. A. Rosales
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  3. E. Marcano
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Additional information

Parts of this work have been funded by an international program between CONICIT (Venezuela) and NSF (United States of America).

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LaBrecque, J.J., Rosales, P.A. & Marcano, E. The analysis of ruthenium catalysts by photon-induced X-ray fluorescence using a microcomputer for data acquisition and analysis. Journal of Radioanalytical and Nuclear Chemistry, Articles 89, 455–463 (1985). https://doi.org/10.1007/BF02040609

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  • DOI: https://doi.org/10.1007/BF02040609

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