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XRF and PIXE analysis of metallic glasses

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Abstract

Radionuclide X-ray fluorescence (XRF) and particle induced X-ray emission (PIXE) methods have been used for a rapid and nondestructive analysis of metallic glasses. The methods are compared in accuracy and precision with the atomic absorption method. Some results of analyses of FexNi80-xB20 materials are briefly reviewed. The distribution of elements along the width as well as length and a qualitative analysis of the composition of material surfaces are considered.

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Authors and Affiliations

  1. Institute of Physics, EPRC, Slovak Academy of Sciences, Dúbravská cesta, 842 28, Bratislava, (Czechoslovakia)

    V. Kliment & R. Ŝandrik

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  1. V. Kliment
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  2. R. Ŝandrik
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Kliment, V., Ŝandrik, R. XRF and PIXE analysis of metallic glasses. Journal of Radioanalytical and Nuclear Chemistry, Articles 122, 285–289 (1988). https://doi.org/10.1007/BF02037773

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  • DOI: https://doi.org/10.1007/BF02037773

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