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Analytical applications of neutron depth profiling

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Abstract

Using a low-energy neutron beam as an isotopic probe, neutron depth profiling (NDP) provides quantitative depth profiles in nearly all solid matrix materials. Several of the light elements, such as He, Li, B, and N can be nondestructively analyzed by NDP. The information obtained using NDP is difficult if not impossible to determine by non-nuclear techniques. As a result, NDP is used collaboratively with techniques such as SIMS, RBS, FTIR, PGAA, and AES. Profiles measured by NDP are given for semiconductor and optical processing materials, and light weight alloys. Improvements in the technique are discussed with emphasis on the use of intense cold neutron beams.

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Authors and Affiliations

  1. Center for Analytical Chemistry, National Bureau of Standards, 20899, Gaithersburg, Maryland, (USA)

    R. G. Downing, J. T. Maki & R. F. Fleming

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  1. R. G. Downing
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  2. J. T. Maki
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  3. R. F. Fleming
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Downing, R.G., Maki, J.T. & Fleming, R.F. Analytical applications of neutron depth profiling. Journal of Radioanalytical and Nuclear Chemistry, Articles 112, 33–46 (1987). https://doi.org/10.1007/BF02037274

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