Technological innovations in high count-rate instrumentation

Abstract

Measurements at counting rates above 50,000 counts per second require specialized pulse processing electronics. New preamplifier technology incorporating an injection junction field effect transistor with integral reset gate provides superior throughput with better low energy resolution. Data acquisition at short peaking times permits maximum throughput with minimum pile-up. Over the past ten years, amplifier throughput of unpiled-up pulses improved. Now it is possible to correct the pulse amplitudes as they are processed, improving performance over older methods. Trapping and ballistic deficit are both greater in high rate measurements, where the shorter amplifier peaking times employed result in larger amplitude variations of the amplifier output pulse. Charge trapping may occur in any sized detector. The Goulding-Landis method corrects best for charge carrier trapping while the Hinshaw method works best for ballistic deficit effects.