Abstract
A field experiment with three potato cultivars, where plants were inoculated withPhytophthora infestans, was used to parameterize a model of potato growth and blight population dynamics. The model was validated by accurately simulating a field experiment conducted in another year. Sensitivity analysis with the model showed that late cultivars are longer able to maintain a green canopy in the presence of disease, but still suffer more yield loss than early cultivars. The level of partial resistance of a cultivar was more important than its level of tolerance, and other plant characteristics. The model calculations showed that only between 4 and 15% of the yield loss in the experiments was due to accelerated leaf senescence caused by the disease; the major part of the loss was caused by lesion coverage of leaves.
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Van Oijen, M. Evaluation of breeding strategies for resistance and tolerance to late blight in potato by means of simulation. Netherlands Journal of Plant Pathology 98, 3–11 (1992). https://doi.org/10.1007/BF01998073
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DOI: https://doi.org/10.1007/BF01998073