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Application of thin-film DTA to amorphous selenium layers

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Abstract

A system of evaporated thin-film Ag-Bi thermocouples was used as a differential temperature sensor for DTA measurements. The crystallization of thin amorphous selenium layers was observed by means of this method. The presented method may be useful in studying the thermal transformations of thin films that have different compositions and various applications.

Résumé

Des thermocouples en films minces évaporés Ag-Bi ont été utilisés pour la détection de la différence de température en ATD. On a observé, par cette méthode, la cristallisation des couches minces de sélénium amorphe. La méthode présentée peut être utile dans l'étude des transformations thermiques des pellicules minces de compositions différentes et d'applications diverses.

Zusammenfassung

Das System von aufgedampften Ag-Bi Dünnschicht-Thermoelementen wurde als Differentialtemperatursensor zu DTA-Messungen eingesetzt. Die Kristallisation dünner amorpher Selenschichten wurde durch diese Methode verfolgt. Die beschriebene Methode kann bei der Untersuchung thermischer Umwandlungen der dünnen Schichten verschiedener Zusammensetzungen Anwendung finden.

Резюме

В качестве дифференц иального температур ного сензора в измерениях ДТА была использована систем а тонкопленочных Ag-Bi те рмопар, полученных из газово й фазы. С помощью этого метод а наблюдалась криста ллизация тонких аморфных слое в селена. Представленный мето д может быть использо ван для изучения термически х превращений в тонких пленках разл ичных составов и назн ачений.

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Additional information

The work was financially supported by the Ministry of Science, Higher Education and Technology, according to Contract No. MR-I-21.

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Przyłuski, J., Płocharski, J. & Bujwan, W. Application of thin-film DTA to amorphous selenium layers. Journal of Thermal Analysis 21, 235–238 (1981). https://doi.org/10.1007/BF01914206

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  • DOI: https://doi.org/10.1007/BF01914206

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