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Tijani, H., Pichard, C.R. & Tosser, A.J. Independence of the scattering process at the surface of thin metal film in the framework of the multidimensional conduction models. J Mater Sci Lett 6, 555–558 (1987). https://doi.org/10.1007/BF01739282
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DOI: https://doi.org/10.1007/BF01739282