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Electrical characterization of SbSI grown from the melt by a temperature fluctuation technique

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Crystal Growth Centre, Anna University, Madras-25, India

    L. Palaniappan, F. D. Gnanam & P. Ramasamy

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  1. L. Palaniappan
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  2. F. D. Gnanam
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  3. P. Ramasamy
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Palaniappan, L., Gnanam, F.D. & Ramasamy, P. Electrical characterization of SbSI grown from the melt by a temperature fluctuation technique. J Mater Sci Lett 5, 1007–1008 (1986). https://doi.org/10.1007/BF01730264

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  • DOI: https://doi.org/10.1007/BF01730264

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