References
A. C. RASTOGI and S. T. LAKSHMIKUMAR,Pramana J. Phys. 31 (1988) 167.
J. VAN DER MASS, V. A. GASPAROV and D. PAVUNA,Nature 328 (1987) 603.
J. W. EKIN, A. J. PANSON and B. A. BLAKENSHIP,Appl. Phys. Lett. 52 (1988) 331.
K. MIZUSHIMA, M. SAGOI, T. MIURA and J. YOSHIDA,Jpn. J. Appl. Phys. 27 (1988) 11 489.
J. W. EKIN, T. M. LARSON, N. F. BERGREN, A. J. NELSON, A. B. SWARTZLAND, L. L. KAZMERSKI, A. J. PANSON and A. B. BLAKENSHIP,Appl. Phys. Lett. 52 (1988) 1819.
S. T. LAKSHMIKUMAR and A. C. RASTOGI,Appl. Phys. A. in press.
R. G. SHARMA, Y. S. REDDY, S. R. JHA and S. S. DUBEY,Pramana J. Phys. 30 (1988) L81.
W. R. RUNYANIN, “Semiconductor Measurements and Instrumentation” (McGraw-Hill Kogakusha, Tokyo, 1975) p. 187.
P. W. ANDERSON and Z. ZOU,Phys. Rev. Lett. 60 (1988) 132.
S. JIN, R. C. SHERWOOD, R. B. VAN DOVER, T. H. TIEFEL and D. W. JOHNSON, JR,Appl. Phys. Lett. 51 (1987) 203.
R. W. McCULLUM, J. D. VERHOEVEN, M. A. NOACK, E. D. GIBSON, F. C. LAABS and D. K. FINNEMORE,Adv. Ceram. Mater. 2 (1987) 388.
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Wadhwa, A., Lakshmikumar, S.T. & Reddy, Y.S. Structural study of annealed Ag-YBaCu3O7 interfaces. J Mater Sci Lett 8, 977–978 (1989). https://doi.org/10.1007/BF01729967
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DOI: https://doi.org/10.1007/BF01729967