Skip to main content
Log in

AES studies of slip lines in silicon carbide (0001) surface

  • Published:
Journal of Materials Science Letters

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

References

  1. D. KUHLMANN,Z. Metallkde 41 (1950) 129.

    Google Scholar 

  2. A. F. BROWN,Adv. Phys. 1 (1952) 427.

    Google Scholar 

  3. R. MADDIN and N. K. CHEN,Prog. Metal Phys. 5 (1954) 53.

    Google Scholar 

  4. P. H. HOLLOWAY, “Advances in Electronics and Electron Physics”, Vol. 54, (Academic, 1980) p. 241.

  5. M. P. SEAH,Surf. Sci. 53 (1975) 168.

    Google Scholar 

  6. C. LEA,Met. Sci. 3 (1979) 301.

    Google Scholar 

  7. H. J. GRABKE,Mater. Sci. Engng 42 (1980) 91.

    Google Scholar 

  8. C. LEA and E. D. HONDROS,Proc. R. Soc. A377 (1981) 477.

    Google Scholar 

  9. E. HONDROS and C. LEA,Nature 289 (1981) 663.

    Google Scholar 

  10. F. SEITZ, in Proceedings of Symposium on Plastic Deformation of Crystalline Solids, Pittsburg (1950) p. 153.

  11. P. MORGEN, K. L. SEAWARD and T. W. BARBEE Jr,J. Vac. Sci. Technol. A3 (1985) 2108.

    Google Scholar 

  12. J. W. FAUST, Jr, “Silicon Carbide” (Pergamon, 1960) p. 403.

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Suleman, M., Salah-Ud-Din AES studies of slip lines in silicon carbide (0001) surface. J Mater Sci Lett 5, 1285–1286 (1986). https://doi.org/10.1007/BF01729394

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01729394

Keywords

Navigation