References
A. T. KUHN and C. J. MORTINGER,J. Electrochem. Soc. 120 (1973) 23.
S. PUSCHAVER,Chem. Ind. 236 (1975) 52.
W. O'GRADY, C. TWADURA, J. HUANG and E. YEAGER, in “Electroanalysis”, edited by M. W. Breiter (The Electrochemical Society Softbound Symposium Series, Princeton, New Jersey, 1974) pp. 286–97.
S. TRASATTI and G. BUZZANCE,J. Electroanal. Chem. Interfac. Electrochem. 29 (1971) 635.
L. D. BURKE, O. J. MURPHY, J. F. O'NEILL and S. VENKATESAN,J. Chem. Soc. Faraday Trans. 1 73 (1977) 1659.
D. J. PEDDER,Electrocomp. Sci. Technol. 2 (1976) 259.
M. W. SHAFER and J. ARMSTRONG,IBM Tech. Discuss. Bull. 20 (11A) (1978) 4633.
W. D. RYDEN, W. A. REED and E. S. GREINER,Phys. Rev. B6 (1972) 2089.
R. J. SLIVKA and D. N. LANGENBERG,Phys. Lett. A28 (1968) 169.
Y. S. HUANG and FRED H. POLLAK,Solid State Commun. 43 (1982) 921.
L. F. MATTHEISS,Phys. Rev. B13 (1976) 2433.
A. K. GOEL, G. SKORINKO and F. H. POLLAK,ibid. B24 (1981) 7342.
E. SHANTHI, V. DUTTA, A. BANERJEE and K. L. CHOPRA,J. Appl. Phys. 51 (1980) 6243.
J. N. ZEMEL, J. D. JENSEN and R. B. SCHODE,Phys. Rev. A140 (1965) 330.
N. C. SHARMA, D. K. PANDYA, H. K. SEHGAL and K. L. CHOPRA,Thin Solid Films 62 (1979) 97.
H. W. VERLEUR, A. S. BARKER Jr and C. N. BERGLAND,Phys. Rev. 172 (1968) 788.
V. G. MOKEROV and A. V. RAKOV,Sov. Phys. Solid State 10 (1968) 1231.
F. WOOTEN, “Optical Properties of Solids” (Academic Press, New York, 1972) p. 62.
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Park, H.L., Chung, C.H., Kim, C.H. et al. Optical properties of RuO2 thin film. J Mater Sci Lett 6, 1093–1094 (1987). https://doi.org/10.1007/BF01729143
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DOI: https://doi.org/10.1007/BF01729143