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Overlapped image from two separate Ni3Al precipitates during TEM examination

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Journal of Materials Science Letters

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Hu, CT., Ling, P. Overlapped image from two separate Ni3Al precipitates during TEM examination. J Mater Sci Lett 6, 1050–1052 (1987). https://doi.org/10.1007/BF01729128

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  • DOI: https://doi.org/10.1007/BF01729128

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