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Zeitschrift für Physik B Condensed Matter

, Volume 63, Issue 4, pp 471–478 | Cite as

Reflection of heavy ions

  • W. Eckstein
  • J. P. Biersack
Article

Abstract

The backscattering of heavy ions from surfaces is investigated by computer simulation (TRIM.SP). The particle and energy reflection coefficients are shown to scale with the ratio of target mass to ion mass as well as with the reduced energy ε for ε>0.02 and for normal incidence. At lower energies not only the scaling breaks down but also the effect of a chemical binding influences the reflection coefficient. The calculated data include also the dependence of the reflection coefficients on the angle of incidence as well as angular and energy distributions. Simulated results are in reasonable agreement with those from analytical theory and experiment.

Keywords

Spectroscopy Reflection Neural Network Lower Energy Complex System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag 1986

Authors and Affiliations

  • W. Eckstein
    • 1
  • J. P. Biersack
    • 2
  1. 1.Max-Planck-Institut für PlasmaphysikEURATOM-AssociationGarching bei MünchenGermany
  2. 2.Hahn-Meitner-Institut für Kernforschung Berlin GmbHBerlin 39Germany

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