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Highly oriented thin oxide films on single crystals of Fe-Si alloys II. The (111) surface of the substrate

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Czechoslovak Journal of Physics B Aims and scope

Abstract

In Part I (Czech. J. Phys.B 20 (1970), 994), orientational relationships in oxide films grown on the (001) surface of single crystals of some Fe-Si alloys have been described. Part II deals with highly oriented thin oxide films on the (111) surface of the substrate. Typical reflection high energy electron diffraction patterns are shown and orientational relationships between Fe3O4 and the substrate and between α-Fe2O3 and Fe3O4 are given.

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References

  1. Collins L. E., Heavens O. S.: Proc. Phys. Soc.B 70 (1957), 265.

    Google Scholar 

  2. Wagner J. B., Lawless K. R., Gwathmey A. T.: Trans. Metallurg. Soc. AIME221 (1961), 257.

    Google Scholar 

  3. Boggs W. E., Kachik R. H., Pellissier G. E.: J. Electrochem. Soc.114 (1967), 32.

    Google Scholar 

  4. Foley C. L., Kruger J., Bechtoldt C. J.: J. Electrochem. Soc.114, (1967), 994.

    Google Scholar 

  5. Voleník K.: Corrosion Sci.9 (1969), 27.

    Google Scholar 

  6. Voleník K., Pitter J.: Czech. J. Phys.B 20 (1970), 994.

    Google Scholar 

  7. Voleník K.: Corrosion Sci.9 (1969), 15.

    Google Scholar 

  8. Nicholls G. D.: Adv. Phys.4 (1955), 113.

    Google Scholar 

  9. Sewell P. B., Cohen M.: J. Electrochem. Soc.111 (1964), 508.

    Google Scholar 

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The authors are indebted to Ing. B. Sesttk and Ing. S. Kadekovi (Institute of Physics, Czechoslovak Academy of Sciences) who made possible the preparation of single crystalline samples of Fe-Si alloys. The authors express their gratitude to members of the Institute of Solid State Physics, Czechoslovak Academy of Sciences, Dr. M. Rozsival for the possibility of the use of the electron diffraction apparatus, Dr. A. Linek for helpful discussion of some important problems and Miss J. Sikovi for computer calculations of structure factors.

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Voleník, K., Pitter, J. Highly oriented thin oxide films on single crystals of Fe-Si alloys II. The (111) surface of the substrate. Czech J Phys 21, 172–186 (1971). https://doi.org/10.1007/BF01702805

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  • DOI: https://doi.org/10.1007/BF01702805

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