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The single crystal diffraction patterns of silicon

КРИВАЯ ОТРАЖЕНИЯ МОНОКРИСТАЛЛА Si

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Cechoslovackij fiziceskij zurnal B Aims and scope

Abstract

A triple-crystal diffractometer is used to study the single crystal diffraction patterns of Si (111), (220), (333) and good agreement with the dynamical theory of X-ray diffraction on perfect single crystals is found. This proves the possibility of using Si single crystals as in X-ray spectroscopy for a double-crystal spectrometer with a high resolving power as well as for studying very narrow diffraction patterns by means of a triple-crystal diffractometer.

Abstract

С помощью трехкристалльного дифрактометра исследуется кривая отражения для кристаллов Si (111), (220), (333); показано хорошее согласие с динамической теорией дифракции рентгеновского излучения на совершенных монокристаллах. Тем самым показана возможность использования монокристаллов Si в спектроскопии рентгеновского излучения как для двухкристалльного спектрометра с большой разрешающей способностью, так и для исследования узких кривых отражения с помощью трехкристалльного дифрактометра.

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Authors and Affiliations

  1. Institute of Solid State Physics, Czechosl. Acad. Sci., Prague

    R. Bubáková, J. Drahokoupil & A. Fingerland

Authors
  1. R. Bubáková
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  2. J. Drahokoupil
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  3. A. Fingerland
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Additional information

The authors thank R. Šida and F. Hájek for designing and making the automatic equipment for measuring the curves and V. Smutná and A. Irra for carefully performing the auxiliary work.

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Bubáková, R., Drahokoupil, J. & Fingerland, A. The single crystal diffraction patterns of silicon. Czech J Phys 12, 764–775 (1962). https://doi.org/10.1007/BF01691773

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  • DOI: https://doi.org/10.1007/BF01691773

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