Abstract
Under certain oxidation conditions, highly oriented oxide films grow on single crystals of some Fe-Si alloys. A typical two-phase film of this kind was studied in order to reveal the orientational relationships betweenα-Fe2O3 and Fe3O4 on the (001) surface of the substrate. The orientational relationships were determined from reflection high-energy electron diffraction patterns where reflections from both oxides were present.
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The authors are indebted to Ing. B. Šesták and Ing. S. Kadečková who made possible the preparation of single-crystalline samples of Fe-Si alloys in the Institute of Physics, Czechoslovak Academy of Sciences; to Dr. M. Rozsíval (Institute of Solid State Physics, Czechoslovak Academy of Sciences) who enabled the authors to use the electron diffraction apparatus; and to Dr. A. Línek (Institute of Solid State Physics, Czechoslovak Academy of Sciences) for helpful discussion.
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Voleník, K., Pitter, J. Highly oriented thin oxide films on single crystals of Fe-Si alloys. Czech J Phys 20, 994–1002 (1970). https://doi.org/10.1007/BF01691239
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DOI: https://doi.org/10.1007/BF01691239