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Schlieren method and its application for plasma diagnostics

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Czechoslovak Journal of Physics B Aims and scope

Abstract

In recent years experiments were done with the application of the schlieren method for measuring electronic and atomic density gradients in plasma. The method proved to be useful. The aim of this paper is to point out the advantages of this rarely used optical method. The principle, characteristic and application of the mentioned method in plasma physics are described.

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Authors and Affiliations

  1. Institute of Physics, Czechosl. Acad. Sci., Prague, Na Slovance 2, Praha 8, Czechoslovakia

    V. Hermoch

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  1. V. Hermoch
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Hermoch, V. Schlieren method and its application for plasma diagnostics. Czech J Phys 20, 939–949 (1970). https://doi.org/10.1007/BF01691088

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  • DOI: https://doi.org/10.1007/BF01691088

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