Abstract
A new kind of three-crystal spectrometer is designed. The first two crystals are set in antiparallel position which remains constant during measurement. The third crystal is rotated along the horizontal axis perpendicular to the beams leaving the second crystal. Diffraction planes of the first two crystals are assumed to be vertical. The plane of incidence of the third crystal is then also vertical. Since this inctrument permits greatly increased resolution and dispersion, no extreme mechanical precision is required.
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Cukrovarnická 10, Praha 6, Czechoslovakia.
The author wishes to thank Dr. J. Bačkovský, Dr. A. Fingerland, Dr. E. Krouský and ing. O. Renner for numerous discussions.
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Hrdý, J. New high-dispersion high-resolution three-crystal X-ray spectrometer. Czech J Phys 22, 627–629 (1972). https://doi.org/10.1007/BF01690979
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DOI: https://doi.org/10.1007/BF01690979