Abstract
A method of preparing thin metal foils from Fe-Si single crystals suitable for transmission electron microscopy is described in this paper. In contrast to methods used hitherto foils can be prepared from platelets having a very small area (0·07 cm2), the place in the specimen under observation can be located with an accuracy of ±0·1 mm and its orientation with respect to the edges of the platelet can be ascertained.
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The author thanks B. šesták C. Sc. for valuable discussions and comments and P. Lukáš for reading and comments on the manuscript.
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Gemperle, A. Preparation of metal foils from deformed specimens of small dimensions for transmission electron microscopy. Czech J Phys 13, 62–65 (1963). https://doi.org/10.1007/BF01689081
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DOI: https://doi.org/10.1007/BF01689081