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The use of point and line heat sources for measuring thermophysical quantities of plane-parallel plates and thin films

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Cechoslovackij fiziceskij zurnal B Aims and scope

Abstract

In paper [1–3] several new principles of measuring the thermophysical parameters of substances were worked out, especially of semi-conductors on semi-infinite or infinite samples. In practice, however, we often have samples of limited shapes and samples in the form of thin deposited films and for these the methods employed hitherto are very difficult or even impossible to use. In the present paper these principles are applied to samples in the shape of plane-parallel plates, very thin plates (films) and samples of this type with a substrate material. Compared with paper [1] the method of measurement is extended by measurements with a periodically acting source (method of thermal wave).

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Authors and Affiliations

  1. Dept. of Physics, Slovak Technical University, Gottwaldovo nám. 2, Bratislava

    J. Krempaský

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  1. J. Krempaský
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Krempaský, J. The use of point and line heat sources for measuring thermophysical quantities of plane-parallel plates and thin films. Czech J Phys 15, 865–882 (1965). https://doi.org/10.1007/BF01688670

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