Skip to main content
SpringerLink
Log in

Local structure determination by surface XANES spectroscopy of SiO2 amorphous layer on NiO

  • Published:
Journal of Materials Science Letters

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

References

  1. A. BIANCONI,Appl. Surf. Sci. 6 (1980) 392.

    Google Scholar 

  2. G. BELLI, A. SCAFATI, A. BIANCONI, S. MOBILIO, L. PALLADINO, A. REALE and E. BURATTINI,Solid State Commun. 35 (1980) 355.

    Google Scholar 

  3. A. BIANCONI, M. DELL'ARICCIA, P. J. DURHAM and J. B. PENDRY,Phys. Rev. B 26 (1982) 6502.

    Google Scholar 

  4. A. BIANCONI, in “X-ray absorption spectroscopy and applications of EXAFS, SEXAFS and XANES”, edited by R. Prinz and D. Koningsberger (Wiley, New York, 1985).

    Google Scholar 

  5. I. DAVOLI, L. PALLADINO, S. STIZZA and A. BIANCONI,Solid State Commun. 44 (1982) 1555.

    Google Scholar 

  6. D. GOZZI and G. DE MARIA,High Temp. Sci. in press.

  7. D. GOZZI, M. TOMELLINI, A. BIANCONI and M. FANFONI,J. Electroanal. Chem. Interfac. Electrochem. (1985).

  8. A. BIANCONI and R. S. BAUER,Surf. Sci. 99 (1980) 76.

    Google Scholar 

  9. A. BIANCONI,ibid. 89 (1979) 41.

    Google Scholar 

  10. A. BIANCONI, H. PETERSEN, F. C. BROWN and R. Z. BACHRACH,Phys. Rev. A 17 (1978) 1907.

    Google Scholar 

  11. A. BIANCONI, M. DELL'ARICCIA, A. GARGANO and C. R. NATOLI, in “EXAFS and Near Edge Structure”, edited by A. Bianconi, L. Incoccia, S. Stipcich, Springer series in Chemical Physics, Vol. 27 (Springer, 1983) p. 57.

  12. M. DELL'ARICCIA, A. GARGANO, C. R. NATOLI and A. BIANCONI, Preprint LNF 84/51 (p), Laboratori Nazionali di Frascati (1984).

Download references

Author information

Authors and Affiliations

  1. Dipartimento di Fisica, Universitá di Roma, "La Sapienza", P.le Aldo Moro 5, 00185, Roma, Italy

    M. Tomellini, A. Bianconi & J. Garcia

  2. Dipartimento di Chemica, Universitá di Roma, “La Sapienza”, P.le Aldo Moro 5, 00185, Roma, Italy

    D. Gozzi

  3. Enea, TIB Div. Scienza Materiali CRE Casaccia, C.P. 2400, 00100, Casaccia, Roma, Italy

    A. Gargano

  4. Dipartimento di Matematica e Fisica, Universitá di Camerino, 62030, Camerino, Italy

    I. Davoli & A. Marcelli

Authors
  1. M. Tomellini
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. A. Bianconi
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. J. Garcia
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. D. Gozzi
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. A. Gargano
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. I. Davoli
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. A. Marcelli
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Tomellini, M., Bianconi, A., Garcia, J. et al. Local structure determination by surface XANES spectroscopy of SiO2 amorphous layer on NiO. J Mater Sci Lett 5, 441–442 (1986). https://doi.org/10.1007/BF01672355

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF01672355

Keywords

Search

Navigation