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Degradation of the electrical properties of Y2O3—partially stabilized zirconia ceramics owing to microcracking during annealing

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Kyushu Insitute of Technology, 804, Tobata, Kitakyushu, Japan

    M. Kuwabara & M. Ashizuka

  2. Tokyo Research Laboratories, Toyo Soda Manufacturing Co. Ltd, 252, Hayakawa, Ayase, Japan

    Y. Kubota & T. Tsukidate

Authors
  1. M. Kuwabara
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  2. M. Ashizuka
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  3. Y. Kubota
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  4. T. Tsukidate
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Kuwabara, M., Ashizuka, M., Kubota, Y. et al. Degradation of the electrical properties of Y2O3—partially stabilized zirconia ceramics owing to microcracking during annealing. J Mater Sci Lett 5, 7–9 (1986). https://doi.org/10.1007/BF01671417

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  • DOI: https://doi.org/10.1007/BF01671417

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