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Excess noise of the silicon surface barrier detectors

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Czechoslovak Journal of Physics Aims and scope

Conclusions

From our experiments the following conclusions follow:

  1. i)

    The value of a in the l/f a law lies within the intervala ε (0.6, 1.0).

  2. ii)

    The detectors featuring low reverse currentI c havea ≈ 1.0.

  3. iii)

    The cutoff frequency of the noise characteristicf c is at low frequency compared with the using frequency band of the detector.

  4. iv)

    The excess noise is given by generation-recombination process in the volume of the space — charge region of the sample.

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Authors and Affiliations

  1. Technical University of Košice, Park Komenského 13, 041 20, Košice, Czechoslovakia

    J. Vojtek, J. šikula & R. Tykva

  2. Technical University of Brno, Barvičova 85, 662 37, Brno, Czechoslovakia

    J. šikula

  3. Institute of Organic Chemistry and Biochemistry, Czech. Acad. Sci., Flemingovo n. 2, 166 10, Praha 6, Czechoslovakia

    R. Tykva

Authors
  1. J. Vojtek
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  2. J. šikula
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  3. R. Tykva
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Vojtek, J., šikula, J. & Tykva, R. Excess noise of the silicon surface barrier detectors. Czech J Phys 40, 1289–1292 (1990). https://doi.org/10.1007/BF01605058

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  • DOI: https://doi.org/10.1007/BF01605058

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