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Mesure automatique de profondeur de pénétration dans des supraconducteurs utilisant un microprocesseur

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  • Rapport de la Société Suisse de Physique Session de Printemps à Neuchâtel, les 30 et 31 Mars 1978
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Zeitschrift für angewandte Mathematik und Physik ZAMP Aims and scope Submit manuscript

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Bibliographie

  1. A. L. Schawlow, Phys. Rev.113, No. 1 (1959).

  2. P.-A. Probst et al., Rev. Sci. Instrum.17, No. 12 (1976).

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Authors and Affiliations

  1. Institut de Physique Expérimentale de l'Université de Lausanne, CH-1015, Dorigny

    N. J. Imfeld, C. Egloff & L. Rinderer

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  1. N. J. Imfeld
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  2. C. Egloff
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  3. L. Rinderer
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Imfeld, N.J., Egloff, C. & Rinderer, L. Mesure automatique de profondeur de pénétration dans des supraconducteurs utilisant un microprocesseur. Journal of Applied Mathematics and Physics (ZAMP) 29, 715 (1978). https://doi.org/10.1007/BF01601498

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  • DOI: https://doi.org/10.1007/BF01601498

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